User Contributed MET/CAL Procedure ============================================================================= INSTRUMENT: HP44701A Voltmeter (5700) DATE: 24-Jan-94 AUTHOR: User Contributed REVISION: 1.00 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 27 NUMBER OF LINES: 185 CONFIGURATION: Fluke 5700A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- P F W 1.002 HEAD Initial Setup 1.003 DISP Turn on instrument and warm up for 1 hour prior to 1.003 DISP calibration. Connect IEEE cable to connector on 1.003 DISP rear panel of mainframe. 1.004 DISP 1.004 DISP Connect the 5700 OUTPUT to the UUT upper HI 1.004 DISP and LO terminals and the 5700 SENSE terminals 1.004 DISP to the UUT CURRENT SOURCE terminals. 1.005 HEAD {DC Voltage} 1.006 IEEE TRIG AUTO;RQS RDY;NPLC 16;USE 000 1.007 IEEE FUNC DCV;RANGE 300 1.008 5700 300.0000V S 2W 1.009 IEEE [D200]XRDGS 000,1[I] 1.010 MEME 1.011 MEMC 300 V 0.008% 5e-4U #! Test Tol 0.0245, Sys Tol 0.003, TUR 8.167 (>= 4.00). 2.001 IEEE RANGE 30 2.002 5700 30.00000V S 2W 2.003 IEEE [D200]XRDGS 000,1[I] 2.004 MEME 2.005 MEMC 30 V 0.008% 5e-5U #! Test Tol 0.00245, Sys Tol 0.00028, TUR 8.750 (>= 4.00). 3.001 5700 20.00000V S 2W 3.002 IEEE [D200]XRDGS 000,1[I] 3.003 MEME 3.004 MEMC 20 V 0.008% 5e-5U #! Test Tol 0.00165, Sys Tol 0.000108, TUR 15.278 (>= 4.00). 4.001 5700 10.00000V S 2W 4.002 IEEE [D200]XRDGS 000,1[I] 4.003 MEME 4.004 MEMC 10 V 0.008% 5e-5U #! Test Tol 0.00085, Sys Tol 5.4e-005, TUR 15.741 (>= 4.00). 5.001 5700 5.00000V S 2W 5.002 IEEE [D200]XRDGS 000,1[I] 5.003 MEME 5.004 MEMC 5 V 0.008% 5e-5U #! Test Tol 0.00045, Sys Tol 2.9e-005, TUR 15.517 (>= 4.00). 6.001 5700 -5.00000V S 2W 6.002 IEEE [D200]XRDGS 000,1[I] 6.003 MEME 6.004 MEMC -5 V 0.008% 5e-5U #! Test Tol 0.00045, Sys Tol 2.9e-005, TUR 15.517 (>= 4.00). 7.001 5700 -10.00000V S 2W 7.002 IEEE [D200]XRDGS 000,1[I] 7.003 MEME 7.004 MEMC -10 V 0.008% 5e-5U #! Test Tol 0.00085, Sys Tol 5.4e-005, TUR 15.741 (>= 4.00). 8.001 5700 -20.00000V S 2W 8.002 IEEE [D200]XRDGS 000,1[I] 8.003 MEME 8.004 MEMC -20 V 0.008% 5e-5U #! Test Tol 0.00165, Sys Tol 0.000108, TUR 15.278 (>= 4.00). 9.001 5700 -30.00000V S 2W 9.002 IEEE [D200]XRDGS 000,1[I] 9.003 MEME 9.004 MEMC -30 V 0.008% 5e-5U #! Test Tol 0.00245, Sys Tol 0.00028, TUR 8.750 (>= 4.00). 10.001 IEEE RANGE 3 10.002 5700 3.000000V S 2W 10.003 IEEE [D200]XRDGS 000,1[I] 10.004 MEME 10.005 MEMC 3 V 0.008% 5e-6U #! Test Tol 0.000245, Sys Tol 1.9e-005, TUR 12.895 (>= 4.00). 11.001 IEEE RANGE .3 11.002 5700 300.0000mV S 2W 11.003 IEEE [D200]XRDGS 000,1[I] 11.004 MATH MEM=MEM*1000 11.005 MEME 11.006 MEMC 300 mV 0.008% 5e-4U #! Test Tol 2.45e-005, Sys Tol 3e-006, TUR 8.167 (>= 4.00). 12.001 IEEE RANGE .03 12.002 5700 30.00000mV S 2W 12.003 IEEE [D200]XRDGS 000,1[I] 12.004 MATH MEM=MEM*1000 12.005 MEME 12.006 MEMC 30 mV 0.15% 5e-5U #! Test Tol 4.505e-005, Sys Tol 9.6e-007, TUR 46.927 (>= 4.00). 13.001 HEAD {AC Voltage} 13.002 IEEE FUNC ACV;RANGE .2 13.003 5700 200.0000mV 45H S 2W 13.004 IEEE [D200]XRDGS 000,1[I] 13.005 MATH MEM=MEM*1000 13.006 MEME 13.007 MEMC 200 mV 0.5% 0.06U 45H #! Test Tol 0.00106, Sys Tol 3e-005, TUR 35.333 (>= 4.00). 14.001 5700 200.0000mV 500H S 2W 14.002 IEEE [D200]XRDGS 000,1[I] 14.003 MATH MEM=MEM*1000 14.004 MEME 14.005 MEMC 200 mV 0.5% 0.06U 500H #! Test Tol 0.00106, Sys Tol 3e-005, TUR 35.333 (>= 4.00). 15.001 IEEE RANGE 2 15.002 5700 2.000000V 45H S 2W 15.003 IEEE [D200]XRDGS 000,1[I] 15.004 MEME 15.005 MEMC 2 V 0.5% 0.0006U 45H #! Test Tol 0.0106, Sys Tol 0.000157, TUR 67.516 (>= 4.00). 16.001 5700 2.000000V 500H S 2W 16.002 IEEE [D200]XRDGS 000,1[I] 16.003 MEME 16.004 MEMC 2 V 0.5% 0.0006U 500H #! Test Tol 0.0106, Sys Tol 0.000157, TUR 67.516 (>= 4.00). 17.001 IEEE RANGE 20 17.002 5700 20.00000V 45H S 2W 17.003 IEEE [D200]XRDGS 000,1[I] 17.004 MEME 17.005 MEMC 20 V 0.5% 0.006U 45H #! Test Tol 0.106, Sys Tol 0.00157, TUR 67.516 (>= 4.00). 18.001 5700 20.00000V 500H S 2W 18.002 IEEE [D200]XRDGS 000,1[I] 18.003 MEME 18.004 MEMC 20 V 0.5% 0.006U 500H #! Test Tol 0.106, Sys Tol 0.00157, TUR 67.516 (>= 4.00). 19.001 IEEE RANGE 200 19.002 5700 200.0000V 45H S 2W 19.003 IEEE [D200]XRDGS 000,1[I] 19.004 MEME 19.005 MEMC 200 V 0.5% 0.06U 45H #! Test Tol 1.06, Sys Tol 0.017, TUR 62.353 (>= 4.00). 20.001 5700 200.0000V 500H S 2W 20.002 IEEE [D200]XRDGS 000,1[I] 20.003 MEME 20.004 MEMC 200 V 0.5% 0.06U 500H #! Test Tol 1.06, Sys Tol 0.017, TUR 62.353 (>= 4.00). 21.001 HEAD {Resistance} 21.002 IEEE FUNC OHMF;RANGE 30 21.003 5700 19.00000Z S 4W 21.004 IEEE [D200]XRDGS 000,1[I] 21.005 MEME 21.006 MEMC 19 Z 0.02% 6e-4U #! Test Tol 0.0044, Sys Tol 0.000494, TUR 8.907 (>= 4.00). 22.001 IEEE RANGE 300 22.002 5700 190.0000Z S 4W 22.003 IEEE [D200]XRDGS 000,1[I] 22.004 MEME 22.005 MEMC 190 Z 0.015% 5e-4U #! Test Tol 0.029, Sys Tol 0.00323, TUR 8.978 (>= 4.00). 23.001 IEEE RANGE 3E3 23.002 5700 1.900000kZ S 4W 23.003 IEEE [D200]XRDGS 000,1[I] 23.004 MATH MEM=MEM/1000 23.005 MEME 23.006 MEMC 1.9 KZ 0.015% 5e-6U #! Test Tol 0.29, Sys Tol 0.0228, TUR 12.719 (>= 4.00). 24.001 IEEE RANGE 3E4 24.002 5700 19.00000kZ S 4W 24.003 IEEE [D200]XRDGS 000,1[I] 24.004 MATH MEM=MEM/1000 24.005 MEME 24.006 MEMC 19 KZ 0.015% 5e-5U #! Test Tol 2.9, Sys Tol 0.209, TUR 13.876 (>= 4.00). 25.001 IEEE RANGE 3E5 25.002 5700 190.0000kZ S 4W 25.003 IEEE [D200]XRDGS 000,1[I] 25.004 MATH MEM=MEM/1000 25.005 MEME 25.006 MEMC 190 KZ 0.015% 5e-4U #! Test Tol 29, Sys Tol 2.47, TUR 11.741 (>= 4.00). 26.001 IEEE RANGE 3E6 26.002 5700 1.900000MZ S 4W 26.003 IEEE [D200]XRDGS 000,1[I] 26.004 MATH MEM=MEM/1000000 26.005 MEME 26.006 MEMC 1.9 MZ 0.1% 2e-5U #! Test Tol 1920, Sys Tol 36.1, TUR 53.186 (>= 4.00). 27.001 5700 0V S 2W 27.002 END #! T.U.R.s less than 4.00: 0 #! T.U.R.s estimated using RANGE value: 0 #! T.U.R.s not calculated (ASK- U): 0 #! T.U.R.s not computable at compile time: 0 #! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.